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Transmission Electron Microscopy                             

TEM_Jeol_2010F_1 Jeol JEM-2010F: Field emmision TEM                      
Resolution:  Lattice image 0.1 nm, Point image 0.19 nm
Acceleration voltage: 80-200 kV
Magnification: 50 - 1 500 000  in TEM mode










 

JEM_4000EX11
JEM 4000EXII

 

 

 

 

 

 

 

 

 

 



JEM_200CX
JEM 200CX