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Refereed academic publications of 1986

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  1. J.T. M. De Hosson, Dislocation dynamics in solids. In: Dislocations in Solids, Tokyo Un. Press, 261 - 271 (1986), (invited paper) 1
  2. J.T. M. De Hosson, F. W. Schapink, J. R. Heringa, J. J. C.Hamelink, Computed structure of near-coherent twin boundaries compared with TEM observations.Acta Metall. 34, 1051 - 1059 (1986)
  3. J. T. M. De Hosson, G. Boom, U. Schlagowski, O. Kanert, Solution hardening in Al-Zn alloys. Acta Metall. 34, 1571 - 1583 (1986)
  4. F. Kuper, J. T. M. De Hosson, J. F. Verwey, Effects of Fluorine implantation on the kinetics of dry oxidation of silicon. J. Applied Physics. 60, 985 - 990 (1986)
  5. V. Vitek and J. T. M. De Hosson, Interatomic forces and structure of grain boundaries.In: Computer-based microscopic description of the structure andproperties of materials. MRS - Vol. 63, pp. 137 -150 (1986), (invited paper). 1
  6. J. T. M. De Hosson, Superlattice dislocations in L12 ordered alloys containing L12ordered precipitates. Mat. Sci. and Eng. 81, 515 - 524 (1986)
  7. J. T. M. De Hosson, Oh Yonsik, V. Vitek, F. W. Schapink, Atomic structure of (111) twist grain boundaries.Trans. JIM, 285 - 292 (1986) 1
  8. J. T. M. De Hosson, O. Kanert, Moving dislocations investigated by means of pulsed nuclear magnetic resonance. In: Strength of Metals and Alloys, Eds: H. J. McQueen, J.-P.Bailon, J. I. Dickson, J. J. Jonas, M. G. Akben. Pergamon Press, pp. 2047 - 2052 (1986) 1
  9. F. G. Kuper, J. T. M. De Hosson, J. Verwey, The density of oxidation induced stacking faults in damaged silicon. J. Applied Physics 60, 1530 -1533 (1986)
  10. J. L. Lee, J. T. Waber, Y. K. Park, J. T. M. De Hosson, Stages in the recovery of deformed single crystals of Iron studied by Positron Annihilation Techniques. J. Mat. Sci. and Eng. 81, 379 - 390 (1986)
  11. G. J. van der Kolk, A. van Veen, J. T. M. De Hosson, R. H. J.Fastenau, Effects of vacancies near substitutional implants on trappingand desorption of He. Nucl. Instr. Methods B6, 517 - 525 (1986)
  12. G. J. van der Kolk, A. van Veen, J. T. M. De Hosson, L. M. Caspers, Clustering phenomena of implants in tungsten observed with THDS. Nucl. Instr. Methods B6, 525 - 532 (1986)
  13. J. T. M. De Hosson, Oppervlakte modificatietechnieken. In: Nieuwe Toepassingen van Materialen, Samsom, p. 143 (1986), (invited paper). 1
  14. F. G. Kuper, J. T. M. De Hosson, J. F. Verwey, A model for the density of oxidation induced stacking faults in Silicon. In: Defects in Semiconductors, Ed. H. J. Bardeleben, Materials Science Forum, Vol. 10-12, pp. 1015 -11020 (1986) 1
  15. G. Boom, M. Sikkens, J.Th.M. De Hosson, A semi-automatic stereometer, Ultramicroscopy, Volume 19, Issue 1, 83 (1986)



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